A new wavefront measurement was proposed, which was based on active deflectormetry and phase-shift technique. The deflection of imaging rays caused by a phase object could be measured accurately with the phase-shift technique and a removable screen displaying the horizontal and vertical sinusoidal intensity patterns respectively, and then the wavefront distribution could be calculated after extracting the gradients from the deflection. When a phase object was placed between a screen and a calibrated charge coupled device (CCD) camera, the intensity patterns would be distorted. The distortion distribution can be measured, and another different distortion distribution can be got by moving the screen. Therefore the ray deflection and the wavefront can be obtained. The experimental results of a positive lens had confirmed the feasibility of this method.