The rise and decay curves of Er3+ 4F9/2 upconversion emission in oxyfluoride tellurite glass were measured under the excitation at 808 nm from a laser diode driven by square waves. The lifetime of the intermediate state could be determined via rise times. Then the accumulation process of the 4F9/2 population was confirmed. The excitation mechanism of up-conversion red emission under 808 nm excitation was confirmed by the rate equations and analyzing the relationship between the time constants of the rise and decay processes and the intermediate state. Square wave excited upconversion emission may also be used for measuring lifetimes of infrared energy levels with a conventional photomultiplier tube.