Chinese Journal of Lasers, Volume. 18, Issue 2, 88(1991)
Dispersion curve and wavelength determination in flat-crystal X-ray spectrograph
Four analytical expressions, different in form but equivalent to each other, of flat-crystal X-ray spectrograph are presented. Several methods of wavelength determination without reference wavelengths are proposed.
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[in Chinese], [in Chinese]. Dispersion curve and wavelength determination in flat-crystal X-ray spectrograph[J]. Chinese Journal of Lasers, 1991, 18(2): 88