Photonics Research, Volume. 12, Issue 11, 2667(2024)

Sensitivity enhancement of guided mode resonance sensors under oblique incidence

Liang Guo, Lei Xu, and Liying Liu*
Author Affiliations
  • Key Laboratory for Micro and Nanophotonic Structures (Ministry of Education), Department of Optical Science and Engineering, School of Information Science and Engineering, Fudan University, Shanghai 200433, China
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    The sensitivity of guided mode resonance (GMR) sensors is significantly enhanced under oblique incidence. Here in this work, we developed a simplified theoretical model to provide analytical solutions and reveal the mechanism of sensitivity enhancement. We found that the sensitivity under oblique incidence consists of two contributions, the grating sensitivity and waveguide sensitivity, while under normal incidence, only waveguide sensitivity exists. When the two contributions are constructively superposed, as in the case of positive first order diffraction of the grating, the total sensitivity is enhanced. On the other hand, when the two parts are destructively superposed, as in the case of negative first order diffraction, the total sensitivity decreases. The findings are further supported by FDTD numerical calculations and proof-of-concept experiments.

    1. INTRODUCTION

    The guided mode resonance (GMR) effect is a peculiar resonance phenomenon that occurs in waveguide grating structures [1]. When light illuminates a GMR, a sharp resonance peak generates when the evanescent diffractive wave of the grating couples to a guided mode of the waveguide. GMR has a narrow linewidth (<1  nm), high efficiency (100%), and high sensitivity to the change of the surrounding refractive index [24]. Therefore, GMR devices can be used as filters [510], light modulators [11], light switches [12], and polarizers [13].

    GMR sensors have become an increasingly attractive research topic because of their real-time, label-free detection capability [1417]. Up to now, almost all researches and applications are based on normal incidence [1823]; little attention has been paid to GMR sensors under oblique incidence. Qian et al. discovered that under a specific angle of incidence, sensitivity of the sensor (S) has a 2.9-fold improvement compared to that under normal incidence [24]. Unfortunately, the mechanism of enhancement is unknown; no systematic research and theoretical analysis can be found.

    In this paper, we employed approximate slab waveguide theory to analytically explore the sensitivity of GMR sensors and elucidate the sensing mechanism under oblique incidence. We found that the total sensitivity of a GMR sensor consists of grating sensitivity and waveguide sensitivity; when the two parts add up, the total sensitivity can be much higher than that at normal incidence. Further results from numerical calculations and experiments agree well with the analytical results. Our study paves a way to the possibility of obtaining higher sensitivity of GMR by effectively using the addition of grating sensitivity and waveguide sensitivity.

    2. THEORY FOR SENSITIVITY OF GMR SENSORS UNDER OBLIQUE INCIDENCE

    Assuming that the grating layer of a GMR is sufficiently thin to function predominantly as a diffractive element, the GMR can be approximately treated as a three-layer planar waveguide. Consequently, the resonant condition and sensing properties of the GMR can be analyzed using the grating equation and the waveguide eigenvalue equation [21].

    Figure 1 depicts the schematic structure of a GMR sensor. Light of wavelength λ illuminates the grating at an incident angle θi, and we have [21,25] Λ(ncsinθinwsinθd)=jλ,              j=0,±1,.

    Here, Λ is the grating period, nw is the refractive index of the waveguide, θd is the diffraction angle in the waveguide region, nc is the refractive index of the cover medium, and j is the diffraction order of the grating (only the +1st and 1st diffraction orders are considered here). If the wave vector of the diffracted light matches that of a waveguide mode, the incident light couples to the waveguide mode, and resonance is generated. Therefore, we can obtain the following equation: k0nwdwcosθdΦw,cΦw,s=mπ,          m=0,1,2,.k0=2π/λ is the wavenumber of light in vacuum, dw is the thickness of the waveguide, and m is the order of the guided mode. Φw,c and Φw,s represent the phase shift due to total internal reflection at the waveguide-cover medium interface and waveguide-substrate interface; they can be expressed as the following: Φw,c=arctan(nw2nc2)ρ(N2nc2nw2N2)12,Φw,s=arctan(nw2ns2)ρ(N2ns2nw2N2)12.

    Here, we denote ρ=0 for TE (transverse electromagnetic wave) and ρ=1 for TM (transverse magnetic wave) polarization; ns is the refractive index of the substrate, and N is the effective refractive index of the guided mode. When resonance occurs, the jth diffracted wave and the mth guided mode satisfy the phase matching condition. For a slab waveguide, N can be expressed as N=nwsinθd.

    Therefore, combining Eq. (1), N can be rewritten as N=ncsinθijλ/Λ,    j=±1,.

    At normal incidence (e.g., θi=0°), N is the same for +1st and 1st diffracted light. However, when θi0°, +1st and 1st diffraction orders correspond to different N. For a given structure and incident condition, nw,dw,θi,Λ are fixed; resonance wavelength λ is a function of nc. Define a function F(λ,nc) that has a form of the left side of Eq. (2) (only the fundamental mode of the waveguide is considered, i.e., m=0): F(λ,nc)=2πλnwdwcosθdΦw,cΦw,s.

    λ is an implicit function of nc. The sensitivity of the GMR sensor can be written as S=dλdnc=F(λ,nc)ncF(λ,nc)λ.

    Here, F(λ,nc)nc denotes the derivative of nc with respect to the equation [Eq. (7)]; F(λ,nc)λ denotes the derivative of λ with respect to the equation.

    Schematic of a typical GMR sensor and the incident light propagation path under oblique incidence. It usually consists of substrate, waveguide, grating, and cover medium. Light of wavelength λ is incident on the structure; part of the light undergoes reflection (R) and transmission (T), while the remaining light is coupled into the waveguide through the +1st and −1st diffraction orders to form guided modes.

    Figure 1.Schematic of a typical GMR sensor and the incident light propagation path under oblique incidence. It usually consists of substrate, waveguide, grating, and cover medium. Light of wavelength λ is incident on the structure; part of the light undergoes reflection (R) and transmission (T), while the remaining light is coupled into the waveguide through the +1st and 1st diffraction orders to form guided modes.

    3. PERFORMANCE OF THE GMR SENSOR UNDER DIFFERENT STRUCTURAL PARAMETERS

    Figure 2 is the heatmaps of S versus Λ and dw calculated by utilizing Eqs. (1)–(8). nw,nc,ns,θi are set to be 2.12, 1.33, 1.45, 30°, respectively. The resonance excited by the 1st (+1st) diffraction order under TE/TM polarization is represented as TE1st/TM1st (TE+1st/TM+1st); meanwhile the resonance at normal incidence is represented as TE±1st/TM±1st.

    Calculated sensitivity heatmap of the GMR sensor about grating period and waveguide thickness: (a) TE±1st; (b) TM±1st; (c) TE−1st; (d) TM−1st; (e) TE+1st; (f) TM+1st.

    Figure 2.Calculated sensitivity heatmap of the GMR sensor about grating period and waveguide thickness: (a) TE±1st; (b) TM±1st; (c) TE−1st; (d) TM1st; (e) TE+1st; (f) TM+1st.

    It is evident from the figures that S at oblique incidence is higher than at normal incidence. Moreover, S(TE+1st/TM+1st)S(TE−1st/TM−1st) and S(TE±1st/TM±1st),S(TM+1st)>S(TE+1st), S(TM±1st)>S(TE±1st). Conversely, S(TE−1st)>S(TM−1st); this phenomenon will be discussed in the following section. Note that we have neglected the sign of S because only its absolute value is meaningful.

    The dark blue areas to the left of the white dotted lines stand for the cut-off regions. The cut-off region forms because a cut-off waveguide thickness exists for an asymmetric waveguide when the effective refractive index of the waveguide mode N equals the refractive index of one of the cladding layers. Moreover, for GMR, N depends on grating period Λ [see Eq. (6)]. For example, when Λ=500 and 600 nm, the cut-off waveguide thickness of TE±1st mode is 26.67 and 32.00 nm, respectively.

    Note that S increases monotonically with Λ for all resonance modes. Conversely, S of ±1st mode increases with dw initially and then decreases, which is consistent with the previous reports [21,2628]. S of +1st mode behaves similarly to that of ±1st mode; however, for 1st mode, S decreases initially and then increases.

    We found that S also changes dramatically with θi. Figure 3 illustrates the relation of S with θi, where Λ and dw are set to be 720 nm and 200 nm, respectively; it can be seen that as θi increases, S(+1st) increases, meanwhile |S(1st)| decreases first and then increases. Therefore, there must exist a specific incident angle at which the sensitivity is zero. The green (TE) and blue (TM) dots in the figure represent zero-sensitivity points. Here we call these angles “zero angles”; they are 7.23° (TE) and 15.98° (TM), respectively. In addition, there must exist specific angles at which the sensitivity equals that at normal incidence, and we call these angles “critical angles”; they are represented as green (TE) and blue (TM) triangles in the figure at 14.79° and 34.73°, respectively.

    GMR sensitivity as a function of incident angle. The grating period and waveguide thickness are 720 nm and 200 nm, respectively; calculated “zero angles” are 7.23° (TE) and 15.98° (TM), and “critical angles” are 14.79° (TE) and 34.73° (TM), respectively.

    Figure 3.GMR sensitivity as a function of incident angle. The grating period and waveguide thickness are 720 nm and 200 nm, respectively; calculated “zero angles” are 7.23° (TE) and 15.98° (TM), and “critical angles” are 14.79° (TE) and 34.73° (TM), respectively.

    4. VALIDITY OF THE PROPOSED MODEL

    In order to confirm the validity of the proposed theory, we use FDTD Solutions to numerically calculate S. In the calculation, nw,nc,ns,θi,Λ are set to be 2.12, 1.33, 1.45, 30°, 720 nm, respectively. The grating height dg is set to be 10 nm, 30 nm, and 60 nm; the grating refractive index ng is the same as the waveguide (the grating can be considered as the extension of the waveguide), and the filling factor of the grating f is 0.5. Figure 4 plots the relation of S with dw (only TM+1st mode results are presented; similar results apply to the other modes). In the figure, the solid line comes from analytical calculations by the theoretical model; the scattered points are numerical calculations by FDTD Solutions. It is evident that analytical and numerical results agree well when dw is larger than 240 nm. As dw decreases, the evanescent field increases, and the electromagnetic field penetrates into the grating layer, making dg non-negligible. Nevertheless, agreement is better for smaller dg obviously.

    GMR sensitivity of TM+1st mode as a function of waveguide thickness. Grating height is 10 nm, 30 nm, 60 nm.

    Figure 4.GMR sensitivity of TM+1st mode as a function of waveguide thickness. Grating height is 10 nm, 30 nm, 60 nm.

    Note that our theoretical model is built on the assumption that dg is very small; the impact of other parameters on S will show up when dg becomes large. Figure 5 plots the changes of S when the filling factor f,ng, and grating profile change; dg is set to be 60 nm in the calculation. Figure 5(a) illustrates the variation of S with dw for different f. Analytical and numerical calculations show good agreement when dw is larger than 240 nm. Moreover, the agreement becomes better for smaller f, because a smaller f has less influence on the evanescent field of the grating. Figure 5(b) depicts the relation of S with dw for two different ng. When dw is less than 240 nm, two calculation results agree well for smaller ng. On the other hand, when dw is larger than 240 nm, the agreement becomes better for larger ng; it may be because in our theoretical model, we assume ng=nw, and the grating can be considered as an extension of the waveguide. When ng decreases, more electromagnetic field is localized in the waveguide layer, leading to reduced sensitivity. Figure 5(c) plots the change of S versus dw for rectangular and sinusoidal grating profiles. It can be seen that the grating profile exerts a relatively minor influence on S; this can be attributed to the small effective refractive index difference between the rectangular and sinusoidal gratings, such that their impact on the evanescent field difference is negligible.

    GMR sensitivity of TM+1st mode versus waveguide thickness. (a) Grating filling factor is 0.3, 0.5, and 0.7; (b) grating refractive index is 2.12 and 1.60; (c) grating profile is rectangular and sinusoidal.

    Figure 5.GMR sensitivity of TM+1st mode versus waveguide thickness. (a) Grating filling factor is 0.3, 0.5, and 0.7; (b) grating refractive index is 2.12 and 1.60; (c) grating profile is rectangular and sinusoidal.

    Upon the above observations, we can conclude that the theoretical model works well, although there are more or less discrepancies between our model and FDTD calculation. dg,f, and ng have a relatively large influence on S while the influence of the grating profile is relatively small. These results give important guidelines for further experiments.

    5. ANALYSIS ON MECHANISM OF SENSITIVITY ENHANCEMENT UNDER OBLIQUE INCIDENCE

    Rewrite Eqs. (2), (6) to a form as Eqs. (9), (10), respectively: λ=2nwπdw1N2nw2arctan(nw2ns2)ρ(N2ns2nw2N2)12+arctan(nw2nc2)ρ(N2nc2nw2N2)12,λ=Λ(ncsinθiN)/j,            j=±1,.

    The intersection of Eqs. (9) and (10) is the resonance wavelength of GMR, which clearly varies with nc. Figures 6(a)–6(c) are plots of Eqs. (9) and (10) for TM±1st, TM+1st, TM−1st, respectively. Lines for nc=1.33 and nc=1.39 are plotted in each figure, nw,nc,ns,θi,dw,Λ,Δnc are set to be 2.12, 1.33, 1.45, 30°, 200 nm, 720 nm, 0.06, respectively, in the calculation. In the figures, C1,C2 are curves of Eq. (9), C3,C4 are curves of Eq. (10), and the insets in each figure are enlarged region of the intersections. Obviously C3 and C4 coincide at normal incidence [Fig. 6(a)], because λ is independent of nc when θi=0° [see Eq. (10)]; therefore the change of λ only comes from Eq. (9). In addition, it can be seen that the change of λ for TM±1st (Δλ=12.08  nm) is higher than that for TE±1st  (Δλ=5.51  nm).

    Calculated resonance wavelength versus the effective refractive index of the guided mode: (a) TM±1st; (b) TM+1st; (c) TM−1st. Insets are enlarged areas of the red circles.

    Figure 6.Calculated resonance wavelength versus the effective refractive index of the guided mode: (a) TM±1st; (b) TM+1st; (c) TM−1st. Insets are enlarged areas of the red circles.

    When θi0°, both Eqs. (9) and (10) contribute to the change of λ; we call them waveguide sensitivity and grating sensitivity. For +1st diffraction mode [see Fig. 6(b)], when nc changes from 1.33 to 1.39, C1 shifts to C2, and C3 shifts to C4. The entire pathway can be considered as moving from A1 (the intersection of C1 and C3) to A2 (the intersection of C1 and C4) and then to A3 (the intersection of C2 and C4). The variation of λ is accordingly Δλ1 and Δλ2, with the total variation Δλ=Δλ1+Δλ2. Note that both Δλ1 and Δλ2 are positive; thus Δλ is a constructive addition of the two contributions. On the other hand, for 1st mode [see Fig. 6(c)], Δλ1 and Δλ2 have opposite signs; thus Δλ is a destructive addition of the two contributions. This also explains the presence of “zero angle” (Δλ1=Δλ2) and “critical angle” for 1st as shown in Fig. 3.

    In addition, when dw increases, the evanescent field becomes weaker. Grating sensitivity is the dominant contribution; hence |S| can be much larger than that at normal incidence.

    6. EXPERIMENTAL RESULTS AND DISCUSSION

    We conducted an easily implementable experiment to verify the theoretical predictions. In our experiment, the materials of the substrate, waveguide, and grating are SiO2, Ta2O5, and S1805 photoresist, respectively.

    First, a 200 nm Ta2O5 film was deposited on a flat SiO2 substrate via electron beam vapor deposition; the thickness of the waveguide was measured using a spectroscopic ellipsometer (Horiba, UVISEL). Then, an 100  nm thick photoresist film was spun coated on the Ta2O5 waveguide layer to record the grating fringes by using a 442 nm helium cadmium laser. After exposure, 2.38% tetramethylammonium hydroxide (NMD-3) solution was used as the developer to obtain one dimensional grating patterns. The prepared GMR sample is shown in Fig. 7(a). An atomic force microscope (AFM, Bruker, Dimension 5000) was employed to characterize the fabricated sample, as shown in Figs. 7(b) and 7(c); it can be seen from the figures that the depth of the grating is 89.50 nm and the measured period of the manufactured grating is 722.5 nm (take the average of six periods), which is slightly different from the designed value of 720 nm.

    (a) Photograph of the fabricated GMR sensor; (b) 3D image of the holographic grating pattern obtained by AFM; (c) profile of the holographic grating scanned by AFM; the measured grating period is 722.5 nm, and grating depth is 89.50 nm.

    Figure 7.(a) Photograph of the fabricated GMR sensor; (b) 3D image of the holographic grating pattern obtained by AFM; (c) profile of the holographic grating scanned by AFM; the measured grating period is 722.5 nm, and grating depth is 89.50 nm.

    Figure 8 is the schematic experimental setup for measuring the reflection spectra. Light emitted from a super-continuum light source (YSL Photonics, SC-5, spectral range 470–2400 nm) is collimated using a fiber collimator. The collimated light beam passes through an attenuator, a diaphragm, and a polarizer before irradiating on the GMR sample. The reflected light beam is then collected by a spectrometer (Acton Research, SpectraPro-2750). The sample is immersed in aqueous glycerol solutions with concentrations varying from 0% to 40% by volume in 10% increments. The corresponding refractive indices for these solutions are 1.3330 (0%), 1.3466 (10%), 1.3602 (20%), 1.3740 (30%), 1.3880 (40%).

    Schematic illustration of the experimental setup for measuring the reflectance spectra of the GMR sensor.

    Figure 8.Schematic illustration of the experimental setup for measuring the reflectance spectra of the GMR sensor.

    Figure 9 presents both experimental and simulated results. Figure 9(a) is the reflection spectra under different concentrations of aqueous glycerol solutions at normal incidence, with the inset displaying corresponding simulated spectra from FDTD Solutions. Figures 9(b) and 9(c) depict the experimental reflection spectra for TM+1st at 10° and TE−1st at 40°, respectively. Figure 9(d) is the corresponding fitting curves of the peak wavelength to refractive index of the solution for TM+1st at 10°, TE±1st at 0°, and TE−1st at 40°; the slopes of the fitting curves give the sensitivity of the GMR sensor. The fitted experimental and simulated sensitivities are 281.85 and 292.46 nm/RIU for TM+1st at 10°, 75.70 and 70.15 nm/RIU for TE±1st at 0°, and 363.61 and 339.11  nm/RIU for TE−1st at 40°, respectively. Both the resonance wavelength and sensitivity measured in the experiment agree well with simulated results.

    (a) GMR reflection spectra of TE mode at normal incidence, with the refractive index of the aqueous solutions varying from 1.333 to 1.388 with a step of 0.0136. Inset: resonance spectra simulated by FDTD Solutions. (b), (c) Experimental reflection spectra for TM+1st at 10° and TE−1st at 40°. (d) Resonance wavelength change versus refractive index. Blue dots are experimental resonance wavelength, and red dots are calculated resonance wavelength by FDTD Solutions. Lines are linear fittings representing sensitivity.

    Figure 9.(a) GMR reflection spectra of TE mode at normal incidence, with the refractive index of the aqueous solutions varying from 1.333 to 1.388 with a step of 0.0136. Inset: resonance spectra simulated by FDTD Solutions. (b), (c) Experimental reflection spectra for TM+1st at 10° and TE−1st at 40°. (d) Resonance wavelength change versus refractive index. Blue dots are experimental resonance wavelength, and red dots are calculated resonance wavelength by FDTD Solutions. Lines are linear fittings representing sensitivity.

    Figure 10 compares the experimental results with analytically calculated results of S as a function of θi. The resonance wavelength for +1st mode is out of the response of our detector when θi>10°; therefore experimental data are mainly for 1st. It is evident that the experimental results agree well with the theoretical calculations. For +1st, the sensitivity increases proportionally with the incident angle, whereas for 1st, sensitivity transitions from positive to negative as the incident angle increases. After crossing the “zero angle”, the sensitivity goes higher as the incident angle increases. The measured sensitivity of TM+1st is 281.85 nm/RIU at θi=10°, which is almost equivalent to TE−1st at 35° (measured sensitivity is 325.60  nm/RIU) and TM−1st at 40° (measured sensitivity is 281.82  nm/RIU), and this result is 1.65-fold higher than that of normal incidence (TM±1st at 0°; measured sensitivity is 171.19 nm/RIU). Moreover, S of TM+1st is higher than that of TE+1st. For example, the measured sensitivity of TE+1st at 5° is 130.43 nm/RIU, while S of TM+1st at 5° is 225.95 nm/RIU. On the other hand, S of TE−1st is slightly higher than that of TM−1st. The measured sensitivity of TE−1st at 5° and TM−1st at 15° is 6.50  nm/RIU and 17.81  nm/RIU, respectively, indicating the two angles are very close to the “zero angle” as predicted from our theoretical analysis. The highest sensitivity measured in the experiment is 363.61  nm/RIU at TE−1st at 40°, which has a 4.8-fold enhancement in contrast to normal incidence (TE±1st at 0°; measured sensitivity is 75.70 nm/RIU).

    GMR sensitivity as a function of incident angle. The solid lines are calculated curves by the proposed theory (T), and the scattered points are the measured values in the experiment (E).

    Figure 10.GMR sensitivity as a function of incident angle. The solid lines are calculated curves by the proposed theory (T), and the scattered points are the measured values in the experiment (E).

    Deviation of the measured data from the calculated data is mainly because the grating height is neglected. The fabricated grating has a height of 89.50 nm and a refractive index of approximately 1.60 (photoresist), which affects the sensitivity. Less deviation is expected if a smaller height grating is used.

    Higher sensitivity is expected by selecting TM+1st mode at a larger incident angle. For instance, take nw,nc,ns,Λ to be 2.12, 1.33, 1.45, 720 nm, respectively; when θi=60° and dw=280  nm, S can reach 775 nm/RIU, which is more than five times larger than that at normal incidence (147 nm/RIU). Furthermore, using porous glass (n=1.17) as the substrate with dw=161  nm can further increase sensitivity to 1320 nm/RIU at the same incident angle.

    7. CONCLUSION

    To summarize, we found that the sensitivity of GMR sensors under oblique incidence comes from the superposition of grating sensitivity and waveguide sensitivity. The sensitivity of 1st diffraction mode is a destructive superposition of the two contributions while the sensitivity of +1st mode is a constructive superposition. The sensitivity at large incident angle can be five times higher than that at normal incidence. The simplified approximate slab waveguide theory gave quantitatively similar results to numerical calculations, especially when the grating layer is very thin. Our study paves a new way to the possibility of obtaining higher sensitivity of GMR.

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    Liang Guo, Lei Xu, Liying Liu, "Sensitivity enhancement of guided mode resonance sensors under oblique incidence," Photonics Res. 12, 2667 (2024)

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    Paper Information

    Category: Nanophotonics and Photonic Crystals

    Received: May. 24, 2024

    Accepted: Sep. 2, 2024

    Published Online: Nov. 1, 2024

    The Author Email: Liying Liu (lyliu@fudan.edu.cn)

    DOI:10.1364/PRJ.530126

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