Chinese Journal of Lasers, Volume. 28, Issue 7, 637(2001)

High Precision Straightness Device Based on Double-frequency Laser Interference Technique

[in Chinese]1, [in Chinese]2, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    A high precision straightness standard device based on double frequency laser interference and edge reverse techniques was presented in this paper, in which the laser wave length was taken as the measuring datum. This device which could get the accuracy over 0.1 μm/m under common lab condition was applied in astronautics calibration laboratory.

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    [in Chinese], [in Chinese], [in Chinese]. High Precision Straightness Device Based on Double-frequency Laser Interference Technique[J]. Chinese Journal of Lasers, 2001, 28(7): 637

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    Paper Information

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    Received: Apr. 14, 2000

    Accepted: --

    Published Online: Aug. 10, 2006

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