Optics and Precision Engineering, Volume. 33, Issue 1, 1(2025)

Anti-Gray code aided phase-shift method for high-robust 3D measurements

Yun FENG1,2, Peiwu LI2, Wenlei WU2, Jianyu LYV2, Xiaojun LIU1, and Liangzhou CHEN1、*
Author Affiliations
  • 1School of Mechanical Science & Engineering, Huazhong University of Science and Technology, Wuhan430000, China
  • 2Guilin Measuring & Cutting Tool Co.,Ltd, Guilin541000, China
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    To address the challenges of low robustness and accuracy in structured light 3D measurement systems caused by environmental interference and the geometric characteristics of measured objects, this study focuses on improving the system's projection encoding method, projection efficiency, and related algorithms. First, to enhance system robustness, a novel approach combining complementary Gray code and phase-shifting is proposed. Second, to reduce the extended projection time resulting from multiple patterns, a synthetic pattern parallel loading method is introduced, significantly accelerating projection speed. Third, to mitigate issues such as light occlusion and shadows caused by object geometry, a dual-projector single-camera system is designed, expanding the measurement field of view and effectively eliminating shadows. Finally, a comprehensive performance comparison with existing methods, including complementary Gray code with phase-shifting and the multi-frequency heterodyne method, is conducted to validate the proposed approach. Experimental results demonstrate that the proposed method substantially improves system robustness and overall performance. Specifically, the synthetic pattern parallel loading method enhances projection efficiency by 55.51% compared to the baseline approach, achieving a measurement standard deviation of 0.014 mm. The proposed method significantly enhances system robustness and accuracy, surpassing traditional encoding techniques.

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    Yun FENG, Peiwu LI, Wenlei WU, Jianyu LYV, Xiaojun LIU, Liangzhou CHEN. Anti-Gray code aided phase-shift method for high-robust 3D measurements[J]. Optics and Precision Engineering, 2025, 33(1): 1

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    Paper Information

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    Received: Aug. 19, 2024

    Accepted: --

    Published Online: Apr. 1, 2025

    The Author Email:

    DOI:10.37188/OPE.20253301.0001

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