Chinese Journal of Lasers, Volume. 31, Issue s1, 329(2004)

New Method of Laser Scratching to Determine the Bond Strength of the Film-Substrate Interface

FENG Ai-xin1、*, ZHANG Yong-kang1, XIE Hua-kun2, ZHOU Ming1, and CAI Lan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    The bond strength of film-substrate interface is often the predominant factor and chiefly target in determining the performance and reliability of film-substrate system. A new method of infared and deep UV radiation laser scratch testing technique is presented in the article to determine the bond strength of film-substrate interface. The laser scratching mechanism and diagnosis technology of the bonding state of the film-substrate interface are studied on the bases of analyzing the technological advantages of the laser scratching technique.

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    FENG Ai-xin, ZHANG Yong-kang, XIE Hua-kun, ZHOU Ming, CAI Lan. New Method of Laser Scratching to Determine the Bond Strength of the Film-Substrate Interface[J]. Chinese Journal of Lasers, 2004, 31(s1): 329

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    Paper Information

    Category: laser devices and laser physics

    Received: --

    Accepted: --

    Published Online: Jan. 29, 2013

    The Author Email: FENG Ai-xin (aixfeng@ujs.edu.cn)

    DOI:

    CSTR:32186.14.

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