Chinese Journal of Lasers, Volume. 46, Issue 7, 0704003(2019)

Vertical Measurement Method for Structured Light Three-Dimensional Profilometry Based on Phase-Shifting and Modulation Ratio

Mingteng Lu1 and Xianyu Su2、*
Author Affiliations
  • 1 Southwest Institute of Technical Physics, Chengdu, Sichuan 610041, China
  • 2 School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610065, China
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    In this paper, a new modulation measuring profilometry method based on phase-shifting and modulation ratio is proposed in order to balance the measurement speed and accuracy of the traditional methods. In the proposed method, a special projection system comprising a common projection lens and a cylindrical lens is used. Two groups of vertical and horizontal phase shifting sinusoidal grating fringes are projected onto the measurement area. The “image planes” of the two types of fringes are separated by the cylindrical lens, and the measurement area is between the two “image planes.” The modulation distributions of the two types of sinusoidal grating fringes are obtained using a phase shifting algorithm, and the mapping relationship between the modulation ratio of the fringes and the actual position is established. The three-dimensional shape of the object can be reconstructed according to the mapping relationship between modulation ratio of the fringes and the actual position. In addition, the experiments are conducted to evaluate the feasibility of the proposed method.

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    Mingteng Lu, Xianyu Su. Vertical Measurement Method for Structured Light Three-Dimensional Profilometry Based on Phase-Shifting and Modulation Ratio[J]. Chinese Journal of Lasers, 2019, 46(7): 0704003

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    Paper Information

    Category: measurement and metrology

    Received: Jan. 24, 2019

    Accepted: Mar. 11, 2019

    Published Online: Jul. 11, 2019

    The Author Email: Su Xianyu (xysu@scu.edu.cn)

    DOI:10.3788/CJL201946.0704003

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