A phase unwrapping method based on feature extraction of binary grating is proposed in this paper. In traditional phase measuring profilometry based on sinusoidal grating projection, the phase is wrapped between (-π, π］due to the arctangent operation, and it needs to be unwrapped using relative phase unwrapping algorithms such as diamond-type phase unwrapping algorithm in which the accumulation of phase errors is easy to occur or even lead to wrong phase unwrapping; or with the assistance of some additional structured light patterns such as Gray codes, the fringe order may be determined to achieve phase unwrapping without the phase error accumulation. By the proposed method, three-dimensional measurement is achieved by just projecting a set of phase-shifted binary gratings, which can not only avoid the Gamma non-linearity influence of the projector, but also increase the refresh frequency of the projector by more than ten times. At the same time, by using the image characteristics of the binary grating itself, the fringe order can be extracted without increasing any auxiliary structured light pattern. So that the unwrapped phase can be achieved by combining the phase of extracted fringe order with the wrapped phase without the phase error accumulation.The experimental results verify the feasibility and effectiveness of the proposed method, and the solution result is in good agreement with the solution result of the diamond algorithm without cumulative errors.