Opto-Electronic Engineering, Volume. 38, Issue 12, 52(2011)

Digital Measurement of the Stress of KDP Crystal

WEI Xiao-hong*, GAO Bo, LI Qiang, XU Kai-yuan, LIU Ang, and CHAI Li-qun
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    Using the high precision digital stress measurement instrument, we measured the stress of KDP crystal. Through measuring the optical axis of KDP, the birefringence of ordinary light and extraordinary light is diminished, and the inner stress of the KDP is gained, The repeatability of measurement is better than 0.1 nm/cm. The high precision digital stress measurement of KDP is of great importance to machining and utilization.

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    WEI Xiao-hong, GAO Bo, LI Qiang, XU Kai-yuan, LIU Ang, CHAI Li-qun. Digital Measurement of the Stress of KDP Crystal[J]. Opto-Electronic Engineering, 2011, 38(12): 52

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    Paper Information

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    Received: Sep. 20, 2011

    Accepted: --

    Published Online: Dec. 22, 2011

    The Author Email: Xiao-hong WEI (xhwei4@126.com)

    DOI:10.3969/j.issn.1003-501x.2011.12.010

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