MGT-Fusion: PCBA Defect Detection Method Based on Texture and Depth Information Fusion (Invited)

Zefang Chen; Mingyuan Zhong; Hailong Jing; Guodong Liu; Qican Zhang; Junfei Shen

doi:10.3788/LOP251144

Laser & Optoelectronics Progress, Volume. 62, Issue 17, 1739022(2025)

MGT-Fusion: PCBA Defect Detection Method Based on Texture and Depth Information Fusion (Invited)

Zefang Chen¹, Mingyuan Zhong¹, Hailong Jing², Guodong Liu³, Qican Zhang^1、*, and Junfei Shen^1、**

Author Affiliations

¹College of Electronics and Information Engineering, Sichuan University, Chengdu 610065, Sichuan , China

²Sichuan ViSensing Technology Co., Ltd., Chengdu 610065, Sichuan , China

³United Electronics Co., Ltd., Jiangxi, Nanchang 330000, Jiangxi , China

show less

Abstract Get PDF(in Chinese)

Equations(16)

z = L N \{D S C o n v \{S i g m o i d \{L N [D S C o n v (L_{T x} + L_{P x})]\} + L_{T x} + L_{P x}\}\}

（1）

\tilde{M_{T x}} = z L_{T x} + (1 - z) L_{P x}

（2）

\tilde{M_{P x}} = z L_{P x} + (1 - z) L_{T x}

（3）

Q_{x} = I_{T x} W_{Q}

（4）

K_{x} = I_{T x} W_{K}

（5）

V_{x} = I_{T x} W_{V}

（6）

N_{x} = L N [M u l i t y H e a d (Q_{x}, K_{x}, V_{x}) + Q_{x}]

（7）

F_{x} = L N [M L P (N_{x}) + N_{x}]

（8）

M u l i t y H e a d (Q_{x}, K_{x}, V_{x}) = C o n c a t (H_{1}, \dots, H_{h}) W_{O}

（9）

H_{i} = A t t e n t i o n (Q W_{Q, i}, K W_{K, i}, V W_{V, i})

（10）

A t t e n t i o n (Q, K, V) = S o f t m a x (\frac{Q K^{T}}{\sqrt[]{d_{K}}}) V

（11）

P = \frac{N_{T P}}{N_{T P} + N_{F P}} \times 100 %

（12）

R = \frac{N_{T P}}{N_{T P} + N_{F N}} \times 100 %

（13）

A_{A P} = \int_{0}^{1} p (r) d r

（14）

A_{m A P} = \frac{1}{n + 1} \sum_{i = 1}^{n} A_{A P, i}

（15）

f_{F 1_S c o r e} = \frac{2 P R}{P + R} \times 100 %

（16）

Tools

Get Citation

Copy Citation Text

Zefang Chen, Mingyuan Zhong, Hailong Jing, Guodong Liu, Qican Zhang, Junfei Shen. MGT-Fusion: PCBA Defect Detection Method Based on Texture and Depth Information Fusion (Invited)[J]. Laser & Optoelectronics Progress, 2025, 62(17): 1739022

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: AI for Optics

Received: May. 4, 2025

Accepted: Jun. 30, 2025

Published Online: Sep. 8, 2025

The Author Email: Qican Zhang (zqc@scu.edu.cn), Junfei Shen (shenjunfei@scu.edu.cn)

DOI:10.3788/LOP251144

CSTR:32186.14.LOP251144

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology