Journal of Advanced Dielectrics, Volume. 11, Issue 5, 2160014(2021)
Optical properties of BaO6 nanoscale films ( = 0.5 and 0.61) grown by RF-cathode sputtering in an oxygen atmosphere
S. V. Kara-Murza1, K. M. Zhidel2, N. V. Korchikova1, Yu. V. Tekhtelev1, A. V. Pavlenko2,3、*, and L. I. Kiseleva3
Author Affiliations
1Lugansk State Pedagogical University, No. 2 Oboronnaya Street, Lugansk 91000, Ukraine2Research Institute of Physics, Southern Federal University, No. 194 Stachki Avenue, Rostov-on-Don 344090, Russia3Federal State Budgetary Institution of Science “Federal Research Centre, The Southern Scientific Centre of the Russian Academy of Sciences”, No. 41 Chekhova Street, Rostov-on-Don 344090, Russiashow less
The research findings of the phase composition, nanostructure and optical properties of strontium–barium niobate thin films are discussed. BaNb2O6 nanosized films ( = 0.5 and 0.61) were characterized by XRD, SEM and AFM studies. Reflective multi-angle ellipsometry and spectrophotometry were used to determine the optical parameters (refractive index, its dispersion, and thickness of the damaged surface layer) of thin films. It was shown that SBN-50 and SBN-61 thin films were grown -oriented on Al2O3 (0001) and heteroepitaxial on MgO (001) substrates. The increase of refractive index, approaching its maximum value in the bulk material for a given composition as the film thickness increases, is observed.The research findings of the phase composition, nanostructure and optical properties of strontium–barium niobate thin films are discussed. BaNb2O6 nanosized films ( = 0.5 and 0.61) were characterized by XRD, SEM and AFM studies. Reflective multi-angle ellipsometry and spectrophotometry were used to determine the optical parameters (refractive index, its dispersion, and thickness of the damaged surface layer) of thin films. It was shown that SBN-50 and SBN-61 thin films were grown -oriented on Al2O3 (0001) and heteroepitaxial on MgO (001) substrates. The increase of refractive index, approaching its maximum value in the bulk material for a given composition as the film thickness increases, is observed.
