In order to meet the requirement of determining the azimuth angles in fabricating optical devices from photonic crystal fibers (PCFs), a method based on analyzing the forward scattering patterns is proposed. The PCF sample is illuminated transversely by a laser of 650 nm, and the forward scattering patterns and the tip microscopic images are simultaneously recorded. The summary of local intensities of the forward scattering patterns is chosen as the characteristic value. The characteristic value presents good correspondence to the azimuth angles of photonic crystal fiber by comparing the half-image summarized intensities of the forward scattering patterns. Based on this correspondence, the special azimuth angle can be determined. The accuracy within 0.5° obtained in the applications to three kinds of PCFs proves that the proposed method is effective and universal. This method is simple in operation, accurate in determination, and is expected to play an important role in the axial orientation in the fabrication of PCF based devices.