Study of defects in YAG: Nd<sup>3+</sup> crystals by means of cathodoluminescence micrography

HUANG DEQUN; WANG HAOBING; DENG PEIZHEN

Acta Optica Sinica, Volume. 7, Issue 10, 939(1987)

Study of defects in YAG: Nd³⁺ crystals by means of cathodoluminescence micrography

HUANG DEQUN, WANG HAOBING, and DENG PEIZHEN

Author Affiliations

[in Chinese]

show less

Abstract Get PDF(in Chinese)

Using the cathodoluminescence (CL) mode of operation of the scanning electron microscope (SEM), OL images of various defects in YAG:Nd3+ crystals have been obtained. Prther investigation of the formation mechanism of the defects and effects of performances in YAG:Nd3+ crystals has been made according to the OL images.

Keywords

cathodoluminescence microscopy defect in crystal scanning electron microscopy YAG:Nd~（3+） crystal

Tools

Get Citation

Copy Citation Text

HUANG DEQUN, WANG HAOBING, DENG PEIZHEN. Study of defects in YAG: Nd³⁺ crystals by means of cathodoluminescence micrography[J]. Acta Optica Sinica, 1987, 7(10): 939

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Materials

Received: Nov. 25, 1986

Accepted: --

Published Online: Sep. 20, 2011

The Author Email:

DOI:

CSTR:32186.14.

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology