International Journal of Extreme Manufacturing, Volume. 2, Issue 1, 15101(2020)

A high quality surface finish grinding process to produce total reflection mirror for x-ray fluorescence analysis

Hitoshi Ohmori1、*, Shinjiro Umezu1,2, Yunji Kim1, Yoshihiro Uehara1, Hiroshi Kasuga1, Teruko Kato1, Nobuhide Itoh1,3, Syuhei Kurokawa4, Takayuki Kusumi5, Yugo Sugawara6, and Shinsuke Kunimura6
Author Affiliations
  • 1Materials Fabrication Laboratory, RIKEN, Saitama 351-0198, Japan
  • 2Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan
  • 3Department of Mechanical Systems Engineering, Ibaraki University, Ibaraki 316-8511, Japan
  • 4Department of Mechanical Engineering, Kyushu University, Fukuoka 819-0395, Japan
  • 5New technology developments, Akita Industrial Technology Centre, Akita 010-1623, Japan
  • 6Department of Industrial Chemistry, Tokyo University of Science, Tokyo 162-8601, Japan
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    Total reflection x-ray fluorescence analysis is applied to trace element detection in liquid for effective environmental monitoring. This analytical approach requires x-ray total reflection mirrors. In order to achieve high sensitivity element detection, the mirrors require high surface quality for high x-ray reflectivity. Surface finishing for x-ray mirrors is typically conducted through a series of abrasive processes, such as grinding and polishing, and is thus time consuming. The purpose of this study is to streamline and enhance the surface finishing process based on unique high quality grinding techniques for the production of x-ray total reflection mirrors.

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    Hitoshi Ohmori, Shinjiro Umezu, Yunji Kim, Yoshihiro Uehara, Hiroshi Kasuga, Teruko Kato, Nobuhide Itoh, Syuhei Kurokawa, Takayuki Kusumi, Yugo Sugawara, Shinsuke Kunimura. A high quality surface finish grinding process to produce total reflection mirror for x-ray fluorescence analysis[J]. International Journal of Extreme Manufacturing, 2020, 2(1): 15101

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    Paper Information

    Received: Aug. 23, 2019

    Accepted: --

    Published Online: Jun. 4, 2020

    The Author Email: Ohmori Hitoshi (ohmori@mfl.ne.jp)

    DOI:10.1088/2631-7990/ab7a29

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