Opto-Electronic Engineering, Volume. 30, Issue 6, 32(2003)
An infrared temperature-measuring system for a small high-temperature region on semiconductor substrate
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An infrared temperature-measuring system for a small high-temperature region on semiconductor substrate[J]. Opto-Electronic Engineering, 2003, 30(6): 32
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