Study of photoexcited-carrier dynamics in GaAs photoconductive switches using dynamic terahertz emission microscopy: publisher’s note

Hironaru Murakami; Shogo Fujiwara; Iwao Kawayama; Masayoshi Tonouchi

doi:10.1364/prj.4.000208

Photonics Research, Volume. 4, Issue 5, 0208(2016)

Study of photoexcited-carrier dynamics in GaAs photoconductive switches using dynamic terahertz emission microscopy: publisher’s note

Hironaru Murakami^*, Shogo Fujiwara, Iwao Kawayama, and Masayoshi Tonouchi

Author Affiliations

Institute of Laser Engineering, Osaka University, 2-6 Yamadaoka, Suita, Osaka 565-0871, Japan

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This publisher’s note reports corrections to the funding acknowledgment in [Photon. Res. 4, A9–A15 (2016)].

Keywords

Terahertz imaging Ultrafast phenomena

The funding acknowledgment was added to the article ^[1] as follows.

Japan Society for the Promotion of Science (JSPS) KAKENHI Grants-in-Aid for Scientific Research (A) (23246066, 25249049).

The article ^[1] was corrected online as of 25 August 2016.

[1] H. Murakami, S. Fujiwara, I. Kawayama, M. Tonouchi. Study of photoexcited-carrier dynamics in GaAs photoconductive switches using dynamic terahertz emission microscopy. Photon. Res., 4, A9-A15(2016).

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Hironaru Murakami, Shogo Fujiwara, Iwao Kawayama, Masayoshi Tonouchi, "Study of photoexcited-carrier dynamics in GaAs photoconductive switches using dynamic terahertz emission microscopy: publisher’s note," Photonics Res. 4, 0208 (2016)

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Paper Information

Special Issue: OPTICAL VORTICES AND VECTOR BEAMS

Received: Sep. 21, 2016

Accepted: --

Published Online: Nov. 23, 2016

The Author Email: Hironaru Murakami (hiro@ile.osaka-u.ac.jp)

DOI:10.1364/prj.4.000208

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology