Chinese Journal of Lasers, Volume. 37, Issue 3, 685(2010)

Elliptical Crystal Spectrometer Researched for Z-Pinch Plasma X-Ray by Using Au-Wire Arrays

Wang Hongjian1,2、*, Xiao Shali1, Shi Jun1, Huang Xianbin3, Cai Hongchun3, and Xu Daolian1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    To diagnose the presence of electron beams in Z-pinch plasma in spectral range of 0.2-2 nm,two channel X-ray spectrometers respectively using have desirable properties for applications requiring broad spectral coverage,good spectral resolution,and minimized source broadening. A new space resolved focusing elliptical curved crystal spectrometer has been developed and applied to diagnose X-ray of Z-pinch plasma based on focusing spectrograph spatial resolution (FSSR). An elliptical PET(002)crystal was employed with 1348 mm focal length,0.9480 eccentricity and 30°-67.5° Bragg angle. The first experiment was carried out on the Yang accelerator and aimed to investigate the characteristics of high-density plasma and the second did with the spectrometer rotated 90°. X-ray spectra in an absolute intensity scale were obtained from Au-wire Z-pinch plasmas recorded by half-circle X-ray film with radius of 50 mm. It was demonstrated experimentally that the two measured wavelength were same,with spectral resolution λ/Δλ of 300-600,and that spectrograph of elliptically bent PET crystal was a good tool for diagnosing Z-pinch plasmas.

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    Wang Hongjian, Xiao Shali, Shi Jun, Huang Xianbin, Cai Hongchun, Xu Daolian. Elliptical Crystal Spectrometer Researched for Z-Pinch Plasma X-Ray by Using Au-Wire Arrays[J]. Chinese Journal of Lasers, 2010, 37(3): 685

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    Paper Information

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    Received: Apr. 17, 2009

    Accepted: --

    Published Online: Mar. 11, 2010

    The Author Email: Hongjian Wang (whj_cqu@163.com)

    DOI:10.3788/cjl20103703.0685

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