Chinese Journal of Lasers, Volume. 19, Issue 10, 785(1992)
Measurement of thickness and index of refraction of transparent medium
By means of laser speckle photography, the speckle displacement caused by refra ction in transparent medium is measured. The thickness and the index of refraction is then calcu lated. The measured range is wide and the thickness precision is up to the level of micrometer.
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[in Chinese], [in Chinese]. Measurement of thickness and index of refraction of transparent medium[J]. Chinese Journal of Lasers, 1992, 19(10): 785
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