As for advanced super dimension switch (ADS) LCD, using finger to slide the surface of LCD lighting on L255 image, the luminance of sliding areas on LCD reduces owing to the liquid crystal molecules deformation and electrical field. Usually, the liquid crystal of sliding area recovers due to electrical field, and also the luminance of those sliding area recovers. While the dark area can not recover in 5 s, trace Mura occurs. In this paper, by validating the recovery time after finger sliding 5 kinds of panels with different slit end design and slit space values, the impact of pixel design on trace Mura is investigated. Comparing with simulated LC twist angle, a method for evaluating trace Mura of panel is found. The results are as flow: Firstly, for slit end design, panel with arc angle is the best for trace Mura prevention, and panel with open tilt is the worst, of course, panel with tangent tilt design appears middle risk for trace Mura. Simultaneously, narrower slit space design also appears faster recovery time and also is beneficial to trace Mura prevention. Secondly, reducing gray level of panel by setting a lower driving voltage is beneficial to trace Mura and also a good method for erasing trace Mura. Finally, the results of recovery time after sliding and simulated LC twist variations at slit end show that panel with larger than －15° LC twist variation has higher risk for trace Mura, which could be a method for evaluating trace Mura risk of ADS LCD.