Spectroscopic Mueller Metrix Polarimetry Based on Spectral Modulation and Division of Amplitude Demodulation

Zhongxun DENG; Naicheng QUAN; Siyuan LI; Chunmin ZHANG

doi:10.3788/gzxb20245304.0430004

Acta Photonica Sinica, Volume. 53, Issue 4, 0430004(2024)

Spectroscopic Mueller Metrix Polarimetry Based on Spectral Modulation and Division of Amplitude Demodulation

Zhongxun DENG^1,2、*, Naicheng QUAN², Siyuan LI³, and Chunmin ZHANG⁴

Author Affiliations

¹Shenmu Vocational and Technical College， Shenmu719300， China

²School of Materials Science and Engineering， Xi'an University of Technology， Xi'an 710048， China

³Key Laboratory of Spectral Imaging Technology CAS， Xi'an Institute of Optics and Precision Mechanics， Chinese Academy of Sciences， Xi'an 710119China

⁴School of Science， Xi'an Jiaotong University， Xi'an 710049， China

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Zhongxun DENG, Naicheng QUAN, Siyuan LI, Chunmin ZHANG. Spectroscopic Mueller Metrix Polarimetry Based on Spectral Modulation and Division of Amplitude Demodulation[J]. Acta Photonica Sinica, 2024, 53(4): 0430004

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Paper Information

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Received: Sep. 5, 2023

Accepted: Jan. 10, 2024

Published Online: May. 15, 2024

The Author Email: Zhongxun DENG (quanncx@hotmail.com)

DOI:10.3788/gzxb20245304.0430004

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology