Laser & Optoelectronics Progress, Volume. 61, Issue 12, 1228009(2024)

On-Orbit Test of Modulation Transfer Function for Short-Wave Infrared Camera

Wei Wang1,2、* and Luhe Zhang1,2
Author Affiliations
  • 1The 54th Research Institute of China Electronic Technology Group Corporation, Shijiazhuang 050011, Hebei, China
  • 2Hebei Key Laboratory of Photonic Information Technology and Application, Shijiazhuang 050011, Hebei, China
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    Based on basic principle of slanted-edge for on-orbit test, the slanted-edge is introduced into the short-wave infrared band. By analyzing the on-orbit test processes, ground targets with clear boundaries are selected as edge images to calculate the modulation transfer function within the cut-off frequency. The results at the Nyquist frequency in the along-track and cross-track directions are approximately 0.1. The results show that the on-orbit slanted-edge-based modulation transfer function test method can overcome the limitations of ground pixel resolution on sampling areas, which is suitable for short-wave infrared cameras with small pixel arrays and low resolutions.

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    Wei Wang, Luhe Zhang. On-Orbit Test of Modulation Transfer Function for Short-Wave Infrared Camera[J]. Laser & Optoelectronics Progress, 2024, 61(12): 1228009

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    Paper Information

    Category: Remote Sensing and Sensors

    Received: Oct. 7, 2023

    Accepted: Jan. 4, 2024

    Published Online: Jun. 6, 2024

    The Author Email: Wei Wang (ciomp2015@163.com)

    DOI:10.3788/LOP232235

    CSTR:32186.14.LOP232235

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