Laser & Optoelectronics Progress, Volume. 61, Issue 12, 1228009(2024)
On-Orbit Test of Modulation Transfer Function for Short-Wave Infrared Camera
Based on basic principle of slanted-edge for on-orbit test, the slanted-edge is introduced into the short-wave infrared band. By analyzing the on-orbit test processes, ground targets with clear boundaries are selected as edge images to calculate the modulation transfer function within the cut-off frequency. The results at the Nyquist frequency in the along-track and cross-track directions are approximately 0.1. The results show that the on-orbit slanted-edge-based modulation transfer function test method can overcome the limitations of ground pixel resolution on sampling areas, which is suitable for short-wave infrared cameras with small pixel arrays and low resolutions.
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Wei Wang, Luhe Zhang. On-Orbit Test of Modulation Transfer Function for Short-Wave Infrared Camera[J]. Laser & Optoelectronics Progress, 2024, 61(12): 1228009
Category: Remote Sensing and Sensors
Received: Oct. 7, 2023
Accepted: Jan. 4, 2024
Published Online: Jun. 6, 2024
The Author Email: Wei Wang (ciomp2015@163.com)
CSTR:32186.14.LOP232235