Opto-Electronic Engineering, Volume. 34, Issue 11, 61(2007)
Sub-wavefront slope measurement based on Talbot effect moiré fringe technology
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Sub-wavefront slope measurement based on Talbot effect moiré fringe technology[J]. Opto-Electronic Engineering, 2007, 34(11): 61
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