Piezoelectrics & Acoustooptics, Volume. 47, Issue 1, 92(2025)

Quality Control and Reliability Evaluation Methods for Chips

AI Yizhi, YANG Yi, and CHEN Hongyu
Author Affiliations
  • CETC Chips Technology Group Co, Ltd, Chongqing 401332, China
  • show less

    As communication devices continue to advance toward greater portability and slimmer designs, the demand for smaller, high-performance surface acoustic wave (SAW) chips has consistently increased. To ensure product quality, implementing effective quality control and reliability testing throughout the chip development and manufacturing processes is essential. An analysis of the failure modes and effects of SAW chips identifies potential risks during both the design and production stages. Based on these findings, appropriate quality control measures were established, and reliability testing methods were developed to improve the chip yield. The effectiveness of these quality control and reliability testing methods has been validated, offering valuable insights for the industry.

    Tools

    Get Citation

    Copy Citation Text

    AI Yizhi, YANG Yi, CHEN Hongyu. Quality Control and Reliability Evaluation Methods for Chips[J]. Piezoelectrics & Acoustooptics, 2025, 47(1): 92

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Sep. 26, 2024

    Accepted: Apr. 17, 2025

    Published Online: Apr. 17, 2025

    The Author Email:

    DOI:10.11977/j.issn.1004-2474.2025.01.015

    Topics