In this paper, the damage characteristics of CYMG series color CCD detectors under 1064 nm continuous laser are investigated. Combining the damage morphology, damage depth of the multi-layer structure of the color CCD, and the output image after laser irradiation, the damage mechanism of the color CCD is analyzed. Based on experimental observations, the damage process of the color CCD is divided into three stages: point damage, line damage, and complete damage. The study indicates that in the point damage stage, the color change in the output image of the color CCD is primarily caused by damage to color separation filter induced by the 1064 nm laser. In the line damage stage, longitudinal white bright line damage occurs. This is due to the fact that part of the laser light is transmitted and diffracted into the transfer channel, causing signal charge overflow from the transmission potential well. Damage between the clock lines and various electrodes results in some pixels being unable to transfer the signal charge packets through clock drivers, producing lateral dark lines. During the complete damage stage, damage to the N-type silicon substrate prevents signal charges from completing conversion, storage, and transfer processes, leading to the total loss of imaging capability in the color CCD.