Opto-Electronic Engineering, Volume. 39, Issue 11, 134(2012)

Improvement of Dual-optical Path d/0 Condition on Spectrophotometer

WANG Cong*, JIN Shang-zhong, and YUAN Kun
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  • [in Chinese]
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    In order to eliminate the errors resulting from fluctuation of light source, the inner surface of integrating sphere is selected as reference in design of dual-optical path d/0 measuring condition on spectrophotometer. However, the repeatability and accuracy of measurement will decrease to a certain degree because of interference by diffuse reflected light of the test sample. This paper improves the dual-optical path d/0 measuring condition, composites LED as test light source, and configures a separated referenced white board substitute for inner surface of integrating sphere in the reference optical path. Then, the experiment is established. The results indicate that this improved dual-optical path d/0 measuring condition could effectively revise the errors caused by diffuse reflected light of test sample.

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    WANG Cong, JIN Shang-zhong, YUAN Kun. Improvement of Dual-optical Path d/0 Condition on Spectrophotometer[J]. Opto-Electronic Engineering, 2012, 39(11): 134

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    Paper Information

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    Received: Apr. 23, 2012

    Accepted: --

    Published Online: Nov. 22, 2012

    The Author Email: Cong WANG (neepoq@yahoo.com.cn)

    DOI:10.3969/j.issn.1003-501x.2012.11.021

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