Frontiers of Optoelectronics, Volume. 17, Issue 3, 27(2024)

Exceptional point enhanced nanoparticle detection in deformed Reuleaux-triangle microcavity

Fei Jinhao, Zhang Xiaobei, Zhang Qi, Yang Yong, Wang Zijie, Deng Chuanlu, Huang Yi, and Wang Tingyun

In this paper, we propose a deformed Reuleaux-triangle resonator (RTR) to form exceptional point (EP) which results in the detection sensitivity enhancement of nanoparticle. After introducing single nanoparticle to the deformed RTR at EP, frequency splitting obtains an enhancement of more than 6 times compared with non-deformed RTR. In addition, EP induced a result that the far field pattern of chiral mode responses significantly to external perturbation, corresponding to the change in internal chirality. Therefore, single nanoparticle with far distance of more than 4000 nm can be detected by measuring the variation of far field directional emission. Compared to traditional frequency splitting, the far field pattern produced in deformed RTR provides a cost-effective and convenient path to detect single nanoparticle at a long distance, without using tunable laser and external coupler. Our structure indicates great potential in high sensitivity sensor and label-free detector.

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Fei Jinhao, Zhang Xiaobei, Zhang Qi, Yang Yong, Wang Zijie, Deng Chuanlu, Huang Yi, Wang Tingyun. Exceptional point enhanced nanoparticle detection in deformed Reuleaux-triangle microcavity[J]. Frontiers of Optoelectronics, 2024, 17(3): 27

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Paper Information

Category: RESEARCH ARTICLE

Received: Apr. 30, 2024

Accepted: Dec. 11, 2024

Published Online: Dec. 11, 2024

The Author Email:

DOI:10.1007/s12200-024-00131-5

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