Laser & Optoelectronics Progress, Volume. 62, Issue 19, 1912001(2025)

High-Energy Large Spot Array Measurement Method Based on Current Inversion

Xuegui Zhu1、*, Gengjian Liu1, Huaiqing Zhang1, Xinyu Cui2, Zhicheng Wu2, and Yuan Fan3
Author Affiliations
  • 1State Key Laboratory of Power Transmission Equipment Technology, Chongqing University, Chongqing 400044, China
  • 2CETC Lantian Technology Co., Ltd., Tianjin 300384, China
  • 3Ceprei Innovation (Chongqing) Technology Co., Ltd., Chongqing 401334, China
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    To address the problems such as small measurement area, low damage threshold, and easy saturation of existing measurement methods in laser wireless power transfer technology, this paper proposes a photovoltaic array measurement method based on current inversion, which uses the photovoltaic array composed of discrete photovoltaic cells to receive laser, and inverts the incident light intensity of the photovoltaic cell based on the mathematical model of the photovoltaic cell and the output current. Based on the output characteristic of the photovoltaic cell and the five-parameter model, the correlation model between light intensity and output current is constructed, and the accuracy of the inversion method is verified through simulation calculations under different light intensities. Light intensities obtained from the inversion are processed using cubic spline interpolation to recover the incident spot, and the total power and uniformity of the large spot are obtained based on the light intensity distribution of the light spot. The theoretical calculations and simulation results show that this method can achieve effective measurement of high-energy large spot. This method is helpful for the optimal design of the laser transmitter and receiver, and also provides a theoretical basis for the development of high-energy large spot measurement instruments.

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    Xuegui Zhu, Gengjian Liu, Huaiqing Zhang, Xinyu Cui, Zhicheng Wu, Yuan Fan. High-Energy Large Spot Array Measurement Method Based on Current Inversion[J]. Laser & Optoelectronics Progress, 2025, 62(19): 1912001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 29, 2024

    Accepted: Sep. 23, 2024

    Published Online: Sep. 24, 2025

    The Author Email: Xuegui Zhu (zhuxuegui@cqu.edu.cn)

    DOI:10.3788/LOP241760

    CSTR:32186.14.LOP241760

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