Optics and Precision Engineering, Volume. 20, Issue 5, 1064(2012)

Cryogenic hysteresis and creep characteristics of piezoelectric bimorph scanner

ZHANG Xuan1、* and PAN Ming2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    The cryogenic hysteresis and creep characteristics of piezoelectric bimorph scanners for cryogenic optical systems in space infrared cameras were studied. The piezoelectric bimorph has superior characteristics of large displacement, high resolution, no self-heating, etc., moreover, it can work efficiently at a cryogenic temperature. However,the inherent hysteresis and creep characteristics of the piezoelectric bmorph have a large impact on the scanning accuracy when it is used for high precision scanning. In this paper, the hysteresis and creep characteristics of a fabricated piezoelectric bimorph scanner were experimentally studied at room temperature and cryogenic temperature and the results were compared. The results indicate that both hysteresis displacement and creep displacement of the piezoelectric bimorph scanner have a large decrease, but the decrease of total travel displacement is much larger, which leads the hysteresis rate and creep coefficient increase more large. The hysteresis rate at 120 K is twice that at 300 K and the creep coefficient at 120 K increases by an order of magnitude as compared with that at 300 K. Results mean that the hysteresis and creep characteristics of piezoelectric bimorph scanner at cryogenic temperature are more serious than it at room temperature, which will bring greater impact when it is used for high precision applications.

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    ZHANG Xuan, PAN Ming. Cryogenic hysteresis and creep characteristics of piezoelectric bimorph scanner[J]. Optics and Precision Engineering, 2012, 20(5): 1064

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    Paper Information

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    Received: Feb. 13, 2012

    Accepted: --

    Published Online: Aug. 8, 2012

    The Author Email: ZHANG Xuan (flyfeatherx@hotmail.com)

    DOI:10.3788/ope.20122005.1064

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