Chinese Journal of Lasers, Volume. 27, Issue 8, 709(2000)
Thermal Stress Damage of Semiconductors Induced by Laser Beam
The problems of temperature rise and thermal stress damage of semiconductors material induced by chemical laser beam are studied by using a numerical and analytical method. Thermal stress and temperature rise distributions at different laser parameters of detector material are calculated. The thermal stress damage threshold of detector material induced by laser beam is obtained.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Thermal Stress Damage of Semiconductors Induced by Laser Beam[J]. Chinese Journal of Lasers, 2000, 27(8): 709
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