OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 22, Issue 6, 37(2024)

Research on Large Size Advanced Bearing Rollers Surface Defects Inspection Microscopic Scattering Imaging Mechanism

LOU Wei-min1,2, CHEN Huan1, YIN Rui-duo1, JU Bing-feng2, YANG Peng1, YE Huai-chu1, LI Fu-cong1, KONG Ming3, LIU Lu3, and YANG Yong-ying2
Author Affiliations
  • 1Zhejiang Institute of Quality Sciences-Zhejiang Key Laboratory of Digital Precision Measurement Technology Research,Hangzhou 310018,China
  • 2Zhejiang University,Hangzhou 310027,China
  • 3China Jiliang University,Hangzhou 310018,China
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    Advanced bearings are widely used in extreme conditions such as high temperature,high speed and high pressure environments. As a key component of bearings,the surface quality of advanced bearing rollers directly determines the performance and reliability of advanced equipment. Hence it is very important to carry out early defect inspection on bearing rollers surface. The working surface of the bearing roller contains cylinder,cone,drum,etc. In addition,roller material is metal and its complex refractive index property combined with a certain degree of surface roughness characteristics will lead to extremely complex optical scattering. So,it is difficult to obtain good contrast in images collected by conventional light field. In order to solve these problems,a far-field electromagnetic scattering simulation model of surface microscopic defects by finite element method is built in this paper. The far-field distribution based on the solution results of the near-field distribution of finite element is calculated by Fresnel diffraction integral formula. The defect scattering imaging under different illumination angles,defect sizes,defect types and other parameters is simulated. Results show that the intensity distribution of the far-field scattered light obtained by the proposed method is basically consistent with that obtained by the full-space finite element method. In the illumination incident angle range 0°~15°,coaxial field illumination can be taken for defect inspection. In the illumination incident angle range 30°~37°,dark field illumination can be taken for defect inspection. The results can provide a theoretical basis for multi-field scattering imaging system design and also help to improve the localization ability of China advanced bearings.

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    LOU Wei-min, CHEN Huan, YIN Rui-duo, JU Bing-feng, YANG Peng, YE Huai-chu, LI Fu-cong, KONG Ming, LIU Lu, YANG Yong-ying. Research on Large Size Advanced Bearing Rollers Surface Defects Inspection Microscopic Scattering Imaging Mechanism[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2024, 22(6): 37

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    Paper Information

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    Received: Jul. 12, 2024

    Accepted: Jan. 21, 2025

    Published Online: Jan. 21, 2025

    The Author Email:

    DOI:

    CSTR:32186.14.

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