Piezoelectrics & Acoustooptics, Volume. 46, Issue 6, 910(2024)

Study on the Properties of Piezoelectric Materials at Low Temperature

HOU Yanqing1...2, LIU Xiaochuan3, LI Jianjun1, WEI Xincheng4, LI Qingchen1 and GUO Shaorui1 |Show fewer author(s)
Author Affiliations
  • 1Anhui University of Science and Technology, Huainan 232001, China
  • 2Institute of Energy, Hefei Comprehensive National Science Center (Anhui Energy Laboratory), Hefei 230051, China
  • 3Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, China
  • 4Southwest Jiaotong University, Chengdu 610031, China
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    To address the application requirements of piezoelectric transducers in low-temperature environments, this study investigates the electromechanical properties of three different piezoelectric materials: PZT-5 ceramics, 1-3 composites and PMN-PT relaxer single crystals. The materials were tested at frequencies of 4 MHz and 2.5 MHz, respectively, within a temperature range of 50-300 K. The experimental results reveal that the resonant frequency (Fs) and electromechanical coupling coefficient (Kt) of PZT ceramics and PMN-PT single crystals exhibit good temperature stability at low temperatures, with a rate of change below 10%. However, the Fs of 1-3 composites shifted toward higher frequencies by 17.0%, and Kt decreased by 24.4%. As temperature decreased, the dielectric properties of all piezoelectric materials declined, while the mechanical quality factors displayed varying trends. At low temperatures, piezoelectric materials exhibit reversible domain wall electrical charge “freezing”, providing important insights for selecting piezoelectric materials suitable for low-temperature transducer applications.

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    HOU Yanqing, LIU Xiaochuan, LI Jianjun, WEI Xincheng, LI Qingchen, GUO Shaorui. Study on the Properties of Piezoelectric Materials at Low Temperature[J]. Piezoelectrics & Acoustooptics, 2024, 46(6): 910

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    Paper Information

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    Received: Aug. 22, 2024

    Accepted: Feb. 13, 2025

    Published Online: Feb. 13, 2025

    The Author Email:

    DOI:10.11977/j.issn.1004-2474.2024.06.013

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