Chinese Journal of Lasers, Volume. 16, Issue 3, 151(1989)
High accuracy measurement of laser induced X-ray spectrum from GaAs Plasma
Tools
Get Citation
Copy Citation Text
Feng Xianpi, Xu Zhishan, Zhang Zhengquan, Chen Shisheng, Zheng Danching. High accuracy measurement of laser induced X-ray spectrum from GaAs Plasma[J]. Chinese Journal of Lasers, 1989, 16(3): 151
Paper Information
Category: Laser physics
Received: Feb. 24, 1987
Accepted: --
Published Online: Aug. 13, 2012
The Author Email:
CSTR:32186.14.
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20