Acta Optica Sinica, Volume. 9, Issue 8, 741(1989)
Absorption losses in single layer optical coatings
Absorption measurements performed by means of transverse photothermal deflection technique for wedge-shaped ZrO2, MgF2, ZnS, TiO2, Ta2O5 and SiO2 single-layer films at λ=6328 A permits a separation of bulk and interface absorption. Experimental results show that for ZrO2, MgF2 and ZnS films investigated, the film-substrate interface absorption and the air-film intterfaoe absorption are nearly the same, while for TiO2, Ta2O5 and SiO2 films, the film-substrate interface absorption dominates over the air-film interfaoe absorption, being the main source of tlie total a Sorption loss.
Get Citation
Copy Citation Text
WU ZHOULING, FAN ZHENGXIU, TANG JINFA. Absorption losses in single layer optical coatings[J]. Acta Optica Sinica, 1989, 9(8): 741
Category: Thin Films
Received: May. 9, 1988
Accepted: --
Published Online: Sep. 20, 2011
The Author Email:
CSTR:32186.14.