Acta Optica Sinica, Volume. 9, Issue 8, 741(1989)

Absorption losses in single layer optical coatings

WU ZHOULING1, FAN ZHENGXIU1, and TANG JINFA2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    Absorption measurements performed by means of transverse photothermal deflection technique for wedge-shaped ZrO2, MgF2, ZnS, TiO2, Ta2O5 and SiO2 single-layer films at λ=6328 A permits a separation of bulk and interface absorption. Experimental results show that for ZrO2, MgF2 and ZnS films investigated, the film-substrate interface absorption and the air-film intterfaoe absorption are nearly the same, while for TiO2, Ta2O5 and SiO2 films, the film-substrate interface absorption dominates over the air-film interfaoe absorption, being the main source of tlie total a Sorption loss.

    Tools

    Get Citation

    Copy Citation Text

    WU ZHOULING, FAN ZHENGXIU, TANG JINFA. Absorption losses in single layer optical coatings[J]. Acta Optica Sinica, 1989, 9(8): 741

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Thin Films

    Received: May. 9, 1988

    Accepted: --

    Published Online: Sep. 20, 2011

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics