Chinese Journal of Lasers, Volume. 42, Issue 10, 1008004(2015)

Multi-Wavelength Phase-Shifting Interferometry Based on Principal Component Analysis

Fan Jinping1,2、*, Xu Xiaofei1, Zhang Wanping1, Lü Xiaoxu1, Zhao Hui1, Liu Shengde1, and Zhong Liyun1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    A technique combined multi-wavelength phase-shifting interferometry with principal component analysis (PCA) is presented. By using a monochrome CCD to simultaneously capture a sequence of in-line phaseshifting interferograms with random and unknown phase shifts at multiple wavelengths, the wrapped phase information of each wavelength can be constructed through using the PCA algorithm. Then an unambiguous phase of an extended synthetic beat wavelength can be determined by multi-wavelength optical phase unwrapping and noise reduction. Both the numerical simulation and experimental results show the simple optical measurement process, fast computing speed and high resolution of the proposed method.

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    Fan Jinping, Xu Xiaofei, Zhang Wanping, Lü Xiaoxu, Zhao Hui, Liu Shengde, Zhong Liyun. Multi-Wavelength Phase-Shifting Interferometry Based on Principal Component Analysis[J]. Chinese Journal of Lasers, 2015, 42(10): 1008004

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    Paper Information

    Category: Measurement and metrology

    Received: Apr. 7, 2015

    Accepted: --

    Published Online: Sep. 24, 2022

    The Author Email: Jinping Fan (frieada@qq.com)

    DOI:10.3788/cjl201542.1008004

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