Analysis, fabrication, and measurement of Y aperture element frequency selective surface

Xiaoqiu Li; Jianmin Zhou; Jinsong Gao

Chinese Optics Letters, Volume. 5, Issue 11, 660(2007)

Xiaoqiu Li^1,2、*, Jianmin Zhou^1,2, and Jinsong Gao³

Author Affiliations

¹Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033

²Graduate School of the Chinese Academy of Sciences, Beijing 100039

³East China Jiaotong University, Nanchang 330013

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The analysis of Y aperture element frequency selective surface (FSS) using the spectral domain method and the moment method is presented. With the vacuum depositing and photolithography, the corresponding Y aperture element FSS was produced, and it was tested in the microwave darkroom. The calculated and measured results are in good agreement.

Keywords

220.3740 240.0310 240.6700 070.6110

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Xiaoqiu Li, Jianmin Zhou, Jinsong Gao, "Analysis, fabrication, and measurement of Y aperture element frequency selective surface," Chin. Opt. Lett. 5, 660 (2007)

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Paper Information

Received: Aug. 6, 2007

Accepted: --

Published Online: Nov. 14, 2007

The Author Email: Xiaoqiu Li (xqiu12@126.com)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology