Laser & Optoelectronics Progress, Volume. 61, Issue 15, 1512004(2024)

Measurement and Modeling of Bidirectional Reflection Distribution Function of Deep Hole Inner Surfaces

Qiang Sheng1,2、*, Jianming Zheng2、**, Lijun Yang1, Haitao Li1, and Junyan Sun1
Author Affiliations
  • 1College of Mechanical and Electrical Engineering, Shaanxi University of Science and technology, Xi'an 710021, Shaanxi, China
  • 2School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, Xi'an 710048, Shaanxi, China
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    A method for measuring and modeling a bidirectional reflection distribution function (BRDF) of the inner surfaces of holes based on endoscope images is proposed, which provides a theoretical basis for hole inner surface defect detection based on machine vision. In this study, an endoscopic imaging reflection model was first established to analyze the relationship between the endoscopic image brightness and its three-dimensional topography. With stainless steel and galvanized threaded holes used as examples, BRDF values of hole inner surfaces were measured by image brightness in the normal direction. Based on the hybrid reflection model, three types of reflection models of the inner surfaces of holes were established. A genetic algorithm was then used to determine the optimal model parameters of different materials and to analyze the model errors. Experimental results show that the inBRDF model based on the Cook-Torrance model can effectively reveal the reflection characteristics of the inner surfaces of holes, and the calculation results of the model are in good agreement with the measurement results. The average fitting error of the two materials is 6.22%, which can accurately describe the reflection characteristics of hole inner surfaces and can be applied to the detection and morphological reconstruction of inner surface defects.

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    Qiang Sheng, Jianming Zheng, Lijun Yang, Haitao Li, Junyan Sun. Measurement and Modeling of Bidirectional Reflection Distribution Function of Deep Hole Inner Surfaces[J]. Laser & Optoelectronics Progress, 2024, 61(15): 1512004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 18, 2023

    Accepted: Jan. 22, 2024

    Published Online: Aug. 12, 2024

    The Author Email: Qiang Sheng (shengqiang@sust.edu.cn), Jianming Zheng (zjm@xaut.edu.cn)

    DOI:10.3788/LOP232691

    CSTR:32186.14.LOP232691

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