Opto-Electronic Engineering, Volume. 34, Issue 12, 61(2007)
BP neural network applied to 3D object measurement based on fringe pattern projection
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. BP neural network applied to 3D object measurement based on fringe pattern projection[J]. Opto-Electronic Engineering, 2007, 34(12): 61
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