In order to screen high reliability and stability area CCD from industrial class devices for the aerospace application, a board level screening and test method for area CCD is put forward and a corresponding screening and test system is designed. To find out unqualified devices, four steps are carried out, consisting of parameters test before aging process, photosensitive property test during the aging process, parameters test afer aging process and long-life experiment for the same batch sampling devices; the judgment of area CCD parameters is made via testing the camera which contains the area CCD; the integrating sphere and guideway are used to test the the bright field and dark field parameters in the darkroom environment. The integrating sphere, the target, the collimator and the six degrees of freedom adjusting system are used to modulation transfer function (MTF) maximum value test. The screening and test of area CCD have been used in engineering practice and passed through a series of test evaluation. The test evaluation results show that the screening and test meet the aerospace applications requirements.