Interferometric imaging technology can accurately measure the tiny deformations or displacements on the surface of objects in a non-contact manner, demonstrating extensive application potential. In this paper, a reflection and transmission interferometric system based on the terahertz band is designed and constructed. This system directly reconstructs images using phase information after scanning. Experiments show that at frequencies of 164 GHz, 172 GHz, 196 GHz, and 204 GHz, the imaging quality and resolution of the Michelson interferometric system are superior to those of the direct measurement method. At 150 GHz, without using any imaging algorithm, the system can achieve half-wavelength resolution, with a contrast improvement of 50% compared to direct measurement. At 180 GHz, a Mach-Zehnder interferometric system is implemented, where the dual-path difference effectively reduces phase noise, thus proving the feasibility and advantages of the system. Terahertz interferometric technology provides a noncontact, high-resolution imaging solution for the imaging field.