Journal of Infrared and Millimeter Waves, Volume. 35, Issue 2, 214(2016)

Band shift of Pb1-xSrxTe thin film and its band alignment using synchrotron radiation photoelectron spectroscope

CAI Chun-Feng1...2,*, PENG Man-Li1, ZHAI Ji-Zhi1, BI Gang1, ZHANG Bing-Po2, WANG Miao2, WU Hui-Zhen2, ZHANG Wen-Hua3 and ZHU Jun-Fa3 |Show fewer author(s)
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  • 1[in Chinese]
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  • 3[in Chinese]
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    The valence band shift in Pb1-xSrxTe thin films with different Sr compositions was studied. The ratio of conduction band offset and valence band offset in this heterostructure has been determined. Without considering the strain effect, the conduction band offset ratio is Qc=ΔEc/ΔEg=0.71, and with considering the strain effect, the energy band of PbTe is degenerated into longitudinal and oblique valleys. The conduction band offset ratio for longitudinal valley is QLC=0.47 and for oblique valley is QOC=0.72, respectively. Pb1-xSrxTe/PbTe heterostructure has a type Ⅰ alignment at the interface, which implies the confinement of both electrons and holes. The accurate determination of band alignment of Pb1-xSrxTe/PbTe heterostructure has great benefits in the research and development of mid-infrared opto-electronic devices.

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    CAI Chun-Feng, PENG Man-Li, ZHAI Ji-Zhi, BI Gang, ZHANG Bing-Po, WANG Miao, WU Hui-Zhen, ZHANG Wen-Hua, ZHU Jun-Fa. Band shift of Pb1-xSrxTe thin film and its band alignment using synchrotron radiation photoelectron spectroscope[J]. Journal of Infrared and Millimeter Waves, 2016, 35(2): 214

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    Paper Information

    Received: Jun. 12, 2015

    Accepted: --

    Published Online: May. 11, 2016

    The Author Email: CAI Chun-Feng (caicf@zucc.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2016.02.017

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