High Power Laser and Particle Beams, Volume. 35, Issue 7, 075002(2023)

Design of a high voltage isolated bipolar sampling circuit with high robustness

Bo Li, Xun Ma, Juan Zhao, Hongtao Li, Xin Zhang, Longfei Kang, Chuanhui Kang, Songjie Li, and Jinshui Xiao*
Author Affiliations
  • Institute of Fluid Physics, CAEP, Mianyang 621900, China
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    According to the requirements of high robustness and positive and negative polarity controllability of the sampling circuit for bipolar charging power supply designed for a large capacity energy storage device, a positive and negative bipolar DC high-voltage isolation sampling circuit with isolation voltage ≥ 30 kV and conversion voltage fractional error ≤ 0.1% has been developed. The voltage/frequency and frequency/voltage conversion methods were adopted, integrated with optical fibers, transformer isolation and other measures, the positive and negative bipolar DC high voltage were isolated and sampled independently at the same time. The problems of the bipolar DC high voltage power supply, such as the voltage imbalance of positive and negative polarity, the incomplete isolation of ground wires between the control signal system and the high power system, and so on were solved. The EMI resistance of the power supply was improved. As the bipolar charging voltage output achieved ± 10 kV, the deviation of positive and negative polarity voltage is less than 0.1%. More than 100 chargers operated reliably and stably under the complex electromagnetic interference environment generated by discharge of the 18.3 MJ pulsed device.

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    Bo Li, Xun Ma, Juan Zhao, Hongtao Li, Xin Zhang, Longfei Kang, Chuanhui Kang, Songjie Li, Jinshui Xiao. Design of a high voltage isolated bipolar sampling circuit with high robustness[J]. High Power Laser and Particle Beams, 2023, 35(7): 075002

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    Paper Information

    Category: Pulsed Power Technology

    Received: Dec. 27, 2022

    Accepted: Apr. 25, 2023

    Published Online: Jul. 24, 2023

    The Author Email: Xiao Jinshui (jinshui_xiao@126.com)

    DOI:10.11884/HPLPB202335.220385

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