Microelectronics, Volume. 52, Issue 1, 109(2022)
Simulation Study on the Effect of Interface Charge on Cylindrical High k VDMOS
Compared with traditional VDMOS, the superjunction and high k dielectric structure VDMOS could achieve higher breakdown voltage and lower on-resistance. The effects of various structural parameters on electric field distribution, breakdown voltage and specific on-resistance of 3D cylindrical high k VDMOS with and without interfacial charges were systematically summarized by simulation software. The variation trend and reason of breakdown voltage and specific on-resistance with parameters were studied and qualitatively analyzed. This study provided a reference for the design of high k VDMOS.
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LIU Yi. Simulation Study on the Effect of Interface Charge on Cylindrical High k VDMOS[J]. Microelectronics, 2022, 52(1): 109
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Received: Jun. 8, 2021
Accepted: --
Published Online: Jun. 14, 2022
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