Journal of Infrared and Millimeter Waves, Volume. 42, Issue 4, 434(2023)

A Dewar vacuum lifetime estimate based on Langmuir adsorption model

Cui FAN1,2,3, Xiao-Kun WANG1,2、*, Peng JI1,2, Lei ZHANG1,2, Jun YU1,2, Yi-Zhang SHEN1,2, De-Feng MO1,2, and Xue LI1,2、**
Author Affiliations
  • 1State Key Laboratories of Transducer Technology,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 2Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 3University of Chinese Academy of Sciences,Beijing 100039,China
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    The main factor affecting the vacuum life of the infrared detector Dewar is the internal material outgassing. The Langmuir adsorption model outgassing equation is used to calculate the vacuum lifetime due to the outgassing mechanism and the long-term degassing procedure of the Dewar. An innovative method of changing the temperature at the end of the degassing procedure was proposed to obtain the outgassing activation energy. The outgassing rate was measured at different temperatures while simultaneously removing the influence of coverage on the outgassing rate. The outgassing rates at storage temperature and the rule of outgassing rate changing over time were deduced. The difference among the three Dewar outgassing activation energies obtained in different conditions was 8.8%. The heat load of the Dewar was tracked for two years to verify the method. The estimated error of Dewar's vacuum lifetime was 7.2%. It is a non-destructive testing estimation method for the vacuum life of small and diverse Dewar.

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    Cui FAN, Xiao-Kun WANG, Peng JI, Lei ZHANG, Jun YU, Yi-Zhang SHEN, De-Feng MO, Xue LI. A Dewar vacuum lifetime estimate based on Langmuir adsorption model[J]. Journal of Infrared and Millimeter Waves, 2023, 42(4): 434

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    Paper Information

    Category: Research Articles

    Received: Oct. 25, 2022

    Accepted: --

    Published Online: Aug. 1, 2023

    The Author Email: Xiao-Kun WANG (lixue@mail.sitp.ac.cn), Xue LI (wxk-sitp@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2023.04.002

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