Optics and Precision Engineering, Volume. 33, Issue 9, 1377(2025)

Refraction error compensation of two displays in direct phase measuring deflectometric system

Xiuxiu TIAN1, Yubo NI1, Zhaozong MENG1, Nan GAO1,4, Zeqing YANG1, Guofeng ZHANG2, Wei YIN3, Hongwei ZHAO2,3, and Zonghua ZHANG1,4、*
Author Affiliations
  • 1College of Mechanical Engineering, Hebei University of Technology, Tianjin30040, China
  • 2College of Mechanical Engineering, Xi'an Jiaotong University, Xi'an710049, China
  • 3National Key Laboratory of Strength and Structural Integrity, Aircraft Strength Research Institute of China, Xi'an710065, China
  • 4Innovation and Research Institute of Hebei University of Technology in Shijiazhuang, Shijiazhuang050299, China
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    In direct phase measuring deflectometric systems, the unique structure of liquid crystal displays (LCDs) and transparent displays (TDs) induces light refraction during measurements, resulting in phase deviations. This study presents a method to compensate for the refractive errors of these displays. By modeling the two displays as a single transparent layered structure, a ray tracing algorithm is employed to establish refraction error models throughout the measurement process. The light propagation paths are analyzed to identify the parameters necessary for correcting phase deviations. Subsequently, multi-stereo vision technology, combined with an optimized three-domain reflection algorithm, is utilized to calibrate the refraction parameters of the displays. Based on a geometric analysis of the system, the refraction angle during measurement is calibrated. Finally, an error compensation formula is derived and applied to correct the depth values pixel by pixel, enhancing measurement accuracy. Experimental results demonstrate that the proposed compensation method reduces the maximum absolute error between the mirror ring and the stepped surface from 33 µm to 21 µm, and decreases the root mean square error (RMSE) of the combined mirror assembly, comprising a concave and a plane mirror, from 38.55 µm to 24.92 µm. These improvements correspond to an overall enhancement of measurement accuracy by 30% to 40%. The method effectively mitigates refraction errors in the two displays and significantly improves the three-dimensional measurement precision of the system.

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    Xiuxiu TIAN, Yubo NI, Zhaozong MENG, Nan GAO, Zeqing YANG, Guofeng ZHANG, Wei YIN, Hongwei ZHAO, Zonghua ZHANG. Refraction error compensation of two displays in direct phase measuring deflectometric system[J]. Optics and Precision Engineering, 2025, 33(9): 1377

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    Paper Information

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    Received: Nov. 30, 2024

    Accepted: --

    Published Online: Jul. 22, 2025

    The Author Email:

    DOI:10.37188/OPE.20253309.1377

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