High Power Laser and Particle Beams, Volume. 36, Issue 2, 025020(2024)

Electrical and thermal aging analysis of all-film pulsed capacitor

Yunqi Huang1,2, Lingyun Wang2、*, Dongdong Zhang1, Lin Chen2, Jianqiang Yuan2, Weiping Xie2,3, Minghai Deng2,3, and Youjun Kong4
Author Affiliations
  • 1School of Electrical Engineering, Dalian University of Technology, Dalian 116024, China
  • 2Institute of Fluid Physics, CAEP, Mianyang 621900, China
  • 3Tianfu Innovation Energy Establishment, Chengdu 610000, China
  • 4State Grid Guowang Integrated Energy Service Group, Ltd., Beijing 100052, China
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    The all-film pulsed capacitor is an important energy storage unit of the pulsed power system, and its lifetime affects the reliability of the whole system. Under the pulse condition, the failure of the all-film pulsed capacitor is mostly a sudden failure, and the life is highly dispersed. To explore the aging and failure mechanism of all-film pulsed capacitors, the life test and the simulation of electric and temperature fields were carried out. The life test of the capacitor was carried out by using the LTD basic discharge unit (brick) experimental chamber to test the life of the capacitor and obtain the failed capacitor, and the failure causes of the failed capacitor under different fault forms were analyzed, and the electric field simulation of the local “electric field distortion” area of the capacitor was carried out by using the finite element analysis software, which showed that the distorted electric field in the above area was the main reason for the breakdown of the insulating medium. The temperature field analysis of the capacitor shows that the temperature of the capacitor is positively correlated with the charge-discharge frequency, and the highest temperature point is located near the geometric center of the capacitor, and the temperature rise of the capacitor is not obvious when the charge-discharge frequency is low, indicating that the aging of the capacitor insulating medium is mainly electrical aging rather than thermal aging at low charge-discharge frequency.

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    Yunqi Huang, Lingyun Wang, Dongdong Zhang, Lin Chen, Jianqiang Yuan, Weiping Xie, Minghai Deng, Youjun Kong. Electrical and thermal aging analysis of all-film pulsed capacitor[J]. High Power Laser and Particle Beams, 2024, 36(2): 025020

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    Paper Information

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    Received: Jun. 1, 2023

    Accepted: Dec. 6, 2023

    Published Online: Mar. 21, 2024

    The Author Email: Lingyun Wang (101kpa@sina.com)

    DOI:10.11884/HPLPB202436.230163

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