Laser & Optoelectronics Progress, Volume. 61, Issue 18, 1812003(2024)

Defect Detection of Spray Printed Variable Color 2D Code Based on ResNet34-TE

Ying Li, Yao Dong*, Zifen He, Hao Yuan, Fuyang Sun, and Lingxi Gong
Author Affiliations
  • Faculty of Mechanical and Electrical Engineering, Kunming University of Science and Technology, Kunming 650500, Yunnan, China
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    Addressing the defect characteristics of multicolor interference and the high complexity of spray-printed variable color 2D codes, along with the challenges of insufficient accuracy and low efficiency in current detection methods used by printing enterprises, this paper proposes a defect classification model by integrating ResNet34 and Transformer structure (ResNet34-TE). Initially, a color 2D code defect dataset is constructed, followed by the introduction of a contour shape detection method to identify the target region and mitigate background interference. ResNet34 serves as the backbone network for feature extraction. In a significant modification, the average pooling layer is omitted, and a Transformer encoder layer is employed to capture the global information of the extracted features, emphasizing the region of interest. Experimental results demonstrate that the accuracy of ResNet34-TE reaches 96.80%, with the average detection time for a single sheet reduced to 15.59 ms. This represents a 5.3 percentage points improvement in accuracy and a 5.8% enhancement in detection speed compared to the baseline model, outperforming classical models. Additionally, on the public defect detection dataset NEU-DET, the proposed model achieves an accuracy of 98.86%, surpassing mainstream defect classification algorithms. Consequently, the proposed model exhibits superior classification effectiveness in defect recognition.

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    Ying Li, Yao Dong, Zifen He, Hao Yuan, Fuyang Sun, Lingxi Gong. Defect Detection of Spray Printed Variable Color 2D Code Based on ResNet34-TE[J]. Laser & Optoelectronics Progress, 2024, 61(18): 1812003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 22, 2023

    Accepted: Jan. 29, 2024

    Published Online: Sep. 14, 2024

    The Author Email: Yao Dong (1823101813@qq.com)

    DOI:10.3788/LOP232723

    CSTR:32186.14.LOP232723

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