In this study, we investigate the stress evolution and its effects on the detection performance of self-rolled quantum well infrared detector. It is found that tensile stress can move the energy level of conduction band up, while compressive stress moves it down. The band movement of self-rolled film with double quantum wells depends on the change of resultant stresses in the two quantum wells. The rolled-up sample can effectively transform the stress change into strain, so as to weaken the impact of ambient temperature and enhance the stability of infrared devices. The wrinkled film has higher compressive stress compared with the rolled-up sample, which results in lower responsivity. When the same bias voltage is applied, the voltage responsivity of the rolled-up sample is about 2.5 times higher than that of the wrinkled sample.