Detection of Nanometer Displacement in Optical-Tweezers and Its Related Measuring Errors

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 31, Issue 6, 729(2004)

[in Chinese]^1、*, [in Chinese]¹, [in Chinese]², [in Chinese]², [in Chinese]², and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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Abstract Get PDF(in Chinese)

Optical Tweezers can be used in measuring nanometer displacements of a particle with several micron diameters. Methods of measurement and data processing, error sources are analyzed. The dynamic image analysis methods including the gray centroid method and new developed methods

Keywords

data-processing methods measuring error nanometer displacement optical-tweezers pico-Newton force optoelectronics

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Detection of Nanometer Displacement in Optical-Tweezers and Its Related Measuring Errors[J]. Chinese Journal of Lasers, 2004, 31(6): 729

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Paper Information

Category: measurement and metrology

Received: Dec. 16, 2002

Accepted: --

Published Online: Jun. 12, 2006

The Author Email: (htchen@mail.ustc.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology