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Chinese Journal of Lasers, Volume. 11, Issue 12, 750(1984)

[in Chinese]

[in Chinese]
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    The flat field and curved field scanning loci obtained by high inertial scanning system are reported and characteristics of curved field scanning are studied.

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    [in Chinese]. [J]. Chinese Journal of Lasers, 1984, 11(12): 750

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    Paper Information

    Category: laser devices and laser physics

    Received: Feb. 24, 1984

    Accepted: --

    Published Online: Sep. 4, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology